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Sheet resistance tester(ol) - List of Manufacturers, Suppliers, Companies and Products

Sheet resistance tester Product List

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Junction Photo Voltage(JPV)

Junction Photo Voltage(JPV)

Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!

The JPV method (Junction Photo Voltage method) allows for fast and reproducible mapping measurements. 【Features】 - Non-contact, non-destructive measurement - No adjustment of probes required - No special sample preparation needed for measurement - Measurement possible even with oxide films or coatings on the surface - High spatial resolution distribution measurement (mapping) can be performed quickly - Highly reproducible measurements are possible - Can be integrated with Semilab's benchtop platforms WT-2000, WT-2500, WT-3000, or inline wafer testing equipment.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment

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Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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FPD Sheet Resistance Measurement Device [NC-50/RG-1200S]

FPD Sheet Resistance Measurement Device [NC-50/RG-1200S]

FPD Sheet Resistance Meter [NC-50/RG-1200S]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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EddyCus(R) TF lab 4040SR-OT-OR-H

EddyCus(R) TF lab 4040SR-OT-OR-H

For non-contact measurements such as photovoltaic cells, semiconductors, and transparent static electricity prevention plates!

The "EddyCus(R) TF lab 4040SR-OT-OR-H" is a non-contact sheet resistance and optical transmission measurement device that can accurately measure the sheet resistance (Ohm/sq), light transmittance, and reflection of conductive thin films. It features manual mapping through user-friendly software and is used for measuring photovoltaic cells, semiconductors, and transparent antistatic plates. Precise measurements of conductive thin films, self-supporting structures, and grid/wire structures are possible. 【Features】 ■ Non-contact measurement ■ Real-time measurement ■ Precise measurement ■ User-friendly software ■ Manual mapping *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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EddyCus(R)TF lab 2020 series

EddyCus(R)TF lab 2020 series

Manual mapping measurements of sheet resistance are possible using user-friendly software.

The "EddyCus(R)TF lab 2020 series" is a non-contact sheet resistance measurement device. It accurately measures the sheet resistance of conductive films at a single point. Additionally, it can measure the thickness of metal film layers and monitor the thickness of thin films and substrates. Upon request, we evaluate the characteristics of multi-layer systems. 【Features】 ■ Non-contact type ■ Real-time measurement ■ Accurate single-point measurement of sheet resistance of conductive films (Ohm/sq) ■ Thickness measurement of metal film layers (nm) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Non-contact sheet resistance measurement device "LEI-1510 Series"

Non-contact sheet resistance measurement device "LEI-1510 Series"

Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.

The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment

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EddyCus(R) TF inline series

EddyCus(R) TF inline series

A suitable solution for measuring the thickness of metal layers, light transmittance, density, and electrical anisotropy.

The "EddyCus(R) TF inline series" is a non-contact inline sheet resistance measurement solution capable of measuring the sheet resistance of thin films and the thickness of metal film layers. It offers advanced variability and flexibility, suitable for both vacuum and atmospheric environments. Equipped with an easy-to-use GUI, comprehensive software, SQL database, statistics, and export functions. 【Features】 ■ Non-contact & real-time measurement ■ Accurate measurements ■ Advanced variability and flexibility ■ Compatible with both vacuum and atmospheric environments ■ Supports single lane and multiple lanes *For more details, please refer to the PDF document or feel free to contact us.

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